A Breakthrough in Combining Complementary Scattering Techniques with Ultrasensitive AFM and SPM for NanoChemical Analysis
• Colocalized IR, Raman, THz and AFM
• Singular protocols for excitation in the IR with Raman and fluorescence detection in the visible
• Image with photon force with pN force sensitivity
• Patented cantilevered completely transparent probes
• Highly localized scattering at the tip
• Versatile configurations with advanced SPM modes of operation: Kelvin Probe chemical potential, electrical, thermal and photon force detection
• Online variable magnetic fields
• Applications in plasmonics of 2D materials, liquids, biology etc.
AFM (Left) and IR (right) images obtained with broadband IR illumination (1000-4000cm-1) at the MIRIAM beamline of the Diamond Light Source, Harwell, United Kingdom