MultiView 1000
Entry-level system with optical capability upgrade
The award winning MultiView 1000TM is an entry-level system that fully integrates all forms of scanning probe microscopy (SPM) with conventional optical microscopy. The MultiView 1000 system provides a cost-effective SPM solution complete with advanced SPM features. The design of the MultiView 1000 emphasizes ease-of-use so that customers with any technical background can quickly make SPM measurements. This system can also be easily upgraded to more sophisticated measurements such as NSOM and AFM-Raman.
MV 1000 Product brochure can be downloaded here
Unprecedented flexibility and performance
Ease of use designed for quick setup with any background. Compatible with NanoToolKit of probes including all third party silicon probes. Easily upgradable to perform sophisticated measurements including AFM-Raman and NSOM
Standard packages include magnetic force microscopy (MFM) and electrostatic force microscopy (EFM); more advanced modes including kelvin force microscopy and scanning capacitance microscopy available in an upgrade
Complete optical access to scanning probe microscopy head
Unique geometry leaves the optical axis free both above and below the sample for integration with upright, inverted, and dual optical (both upright and inverted) microscopy configurations
Accomodates wide variety of probes
Nanonics provides a wide variety of probes that are compatible with the MultiView 1000 including glass, cantilevered probes, thermal probes, electrical and magnetic probes (electrochemical probes, coax probes, glass insulated wire probes), all third party silicon probes, chemical writing probes
Largest Commercially Available Z Scan Range
The large 85 micron x,y, and z-range of the Nanonics 3D Flatscan makes it ideal for optical sectioning in confocal imaging. Used in this way, the MultiView 1000 integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system.
Overall, the MultiView 1000 is a robust and versatile SPM system that allows the user to zoom, with overlapping fields of view, from the lowest resolution of conventional far-field imaging to the higher resolution of confocal microscopy, and finally, to the ultimate resolution of AFM and NSOM.